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Comparing
69
Ga
+
and C
60
+
for ToF-SIMS sputter depth profiling in a Cr
2
O
3
formed during oxidation of a Ce coated FeCr steel substrate
Bexell, Ulf
Dalarna University, School of Technology and Business Studies, Materials Technology.
Engkvist, Josefin
Chalmers University of Technology, Göteborg, Sweden.
Malmberg, Per
Chalmers University of Technology, Göteborg, Sweden.
2012 (English)
Conference paper, Published paper (Other academic)
Place, publisher, year, edition, pages
2012.
National Category
Corrosion Engineering
Research subject
Research Profiles 2009-2020, Steel Forming and Surface Engineering
Identifiers
URN:
urn:nbn:se:du-11560
OAI: oai:DiVA.org:du-11560
DiVA, id:
diva2:581030
Conference
8th European Workshop on Secondary Ion Mass Spectrometry, SIMS Europe 2012, Münster, Germany, 9-11 September 2012.
Available from:
2012-12-28
Created:
2012-12-28
Last updated:
2021-11-12
Bibliographically approved
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Bexell, Ulf
Engkvist, Josefin
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Corrosion Engineering
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ieee
modern-language-association-8th-edition
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ieee
modern-language-association-8th-edition
vancouver
chicago-author-date
chicago-note-bibliography
Other style
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de-DE
en-GB
en-US
fi-FI
nn-NO
nn-NB
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en-GB
en-US
fi-FI
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text
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text
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