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Comparing 69Ga+ and C60+ for ToF-SIMS sputter depth profiling in a Cr2O3 formed during oxidation of a Ce coated FeCr steel substrate
Dalarna University, School of Technology and Business Studies, Materials Technology.
Chalmers University of Technology, Göteborg, Sweden.
Chalmers University of Technology, Göteborg, Sweden.
2012 (English)Conference paper, Published paper (Other academic)
Place, publisher, year, edition, pages
2012.
National Category
Corrosion Engineering
Research subject
Stålformning och ytteknik
Identifiers
URN: urn:nbn:se:du-11560OAI: oai:DiVA.org:du-11560DiVA: diva2:581030
Conference
8th European Workshop on Secondary Ion Mass Spectrometry, SIMS Europe 2012, Münster, Germany, 9-11 September 2012.
Available from: 2012-12-28 Created: 2012-12-28 Last updated: 2014-10-06Bibliographically approved

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CiteExportLink to record
Permanent link

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Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • chicago-author-date
  • chicago-note-bibliography
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
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Output format
  • html
  • text
  • asciidoc
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