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UV-induced in-plane anisotropy in layers of mixture of the azo-dyes SD-1/SDA-2 characterized by spectroscopic ellipsometry
Dalarna University, School of Technology and Business Studies, Materials Technology.ORCID iD: 0000-0001-5910-4355
Dalarna University, School of Technology and Business Studies, Materials Technology.ORCID iD: 0000-0002-5966-590X
2008 (English)In: Physica Status Solidi C - Current topics in solid state physics, vol.5, no.5, 2008, Vol. 5, no 5, 1274-1277 p.Conference paper, (Refereed)
Abstract [en]

The optical properties of the azo-dyes SD-1/SDA-2, which are used for photoaligning of liquid crystals (LCs), are investigated with Variable Angle Spectroscopic Ellipsometry (VASE). Films of mixture of SD-1/SDA-2 are deposited by spin coating on silicon wafers. The estimated thickness is approximately 10 nm. To achieve photo-induced anisotropy, one of the samples is illuminated during 15 minutes with linearly polarized UV light followed by thermal stabilization during 1 hour at 150 degrees C. VASE measurements are performed in the wavelength range 200-1350 rim at several angles of incidence and at different sample orientations. Dielectric functions of azo-dye films without/with polarized UV light illumination were modelled using an ensemble of Lorentz oscillators. The results confirm the diffusion model proposed recently for explanation of the formation of the photo-induced order in azo-dye films under the action of polarized light. Refractive indices, their wavelength dispersion and thicknesses of films of SD-1/SDA-2 are reported here.

Place, publisher, year, edition, pages
2008. Vol. 5, no 5, 1274-1277 p.
National Category
Materials Engineering
Identifiers
URN: urn:nbn:se:du-17683DOI: 10.1002/pssc.200777881ISI: 000256862500066OAI: oai:DiVA.org:du-17683DiVA: diva2:816628
Conference
4th International Conference on Spectroscopic Ellipsometry (ICSE-4), JUN 11-15, 2007, Stockholm, SWEDEN
Available from: 2015-06-03 Created: 2015-06-03 Last updated: 2015-07-29Bibliographically approved

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CiteExportLink to record
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Citation style
  • apa
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